格上点式一致结构的刻划与点式度量化定理

史福贵;郑崇友

Characterizations of Pointwise Uniformities and Pointwise Metrization Theorems on Lattices

Fu Gui SHI(1),Chong You ZHENG(

数学学报 . 2002, (6): 1127 -113 . DOI: 10.12386/A2002sxxb0146