Characterizations of Pointwise Uniformities and Pointwise Metrization Theorems on Lattices

Fu Gui SHI(1),Chong You ZHENG(

Acta Mathematica Sinica, Chinese Series ›› 2002, Vol. 45 ›› Issue (6) : 1127-113.

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中国科学院数学与系统科学研究院期刊网
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Acta Mathematica Sinica, Chinese Series ›› 2002, Vol. 45 ›› Issue (6) : 1127-113. DOI: 10.12386/A2002sxxb0146
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Characterizations of Pointwise Uniformities and Pointwise Metrization Theorems on Lattices

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{{article.zuoZheEn_L}}. {{article.title_en}}. Acta Mathematica Sinica, Chinese Series, 2002, 45(6): 1127-113 https://doi.org/10.12386/A2002sxxb0146

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