Characterizations of Pointwise Uniformities and Pointwise Metrization Theorems on Lattices

Fu Gui SHI(1),Chong You ZHENG(

Acta Mathematica Sinica, Chinese Series ›› 2002, Vol. 45 ›› Issue (6) : 1127-113.

PDF(482 KB)
中国科学院数学与系统科学研究院期刊网
PDF(482 KB)
Acta Mathematica Sinica, Chinese Series ›› 2002, Vol. 45 ›› Issue (6) : 1127-113. DOI: 10.12386/A2002sxxb0146
论文

Characterizations of Pointwise Uniformities and Pointwise Metrization Theorems on Lattices

  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}. Acta Mathematica Sinica, Chinese Series, 2002, 45(6): 1127-113 https://doi.org/10.12386/A2002sxxb0146

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(482 KB)

Accesses

Citation

Detail
Sections
Recommended

/

〈 〉